From a Georgia Tech press release:
New Device Revolutionizes Nano Imaging
Much faster technology allows AFM to capture nano movies, create material properties images
Georgia Tech researchers have created a highly sensitive atomic force microscopy (AFM) technology capable of high-speed imaging 100 times faster than current AFM. . .
Not only is FIRAT™ (Force sensing Integrated Readout and Active Tip) much faster than AFM (the current workhorse of nanotech), it can capture other measurements never before possible with AFM, including material property imaging and parallel molecular assays for drug screening and discovery. FIRAT could also speed up semiconductor metrology and even enable fabrication of smaller devices.
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One hundred times faster -- that's two orders of magnitude. It is advances like this that will enable molecular manufacturing to be developed much sooner than many people expect.